Técnicas Avançadas de Microscopia

Objectives

The objectives of this course are to develop knowledge, skills and competences in various microscopy characterization techniques to understand the relationship between the structure and properties of materials.The idea is to approach microscopy from a theoretical and practical point of view, teaching students how to acquire meaningful and relevant data. The course will focus on providing students the necessary tools to develop solid microscopy techniques and to interpret the data obtained. In the end, the student should be able to critically evaluate research results that rely on the use of these technologies.

Syllabus

1. Introduction, 2. Types of Microscopes, 3. Lenses, Apertures, Aberrations, 4. Beam-Specimen Interactions, 5. Koehler Illumination, Polarization Microscopy, 6. Confocal Microscopy, 7. Scanning Probe Microscopy, 8. Scanning Electron Microscopy, 9. Focused Ion Beam. 10. Crystal Structures of Materials, 11. Theory of Diffraction, 12. Transmission Electron Microscopy.

Prerequisites

Fundamental Concepts in Physics, Chemistry and Mathematics.

Cross Competence Component

The students are required to give oral presentations and defend their work.

Laboratorial Component

There will be hands-on sessions at conventional optical microscopes, confocal microscopes, scanning probe microscopes, scanning electron microscopes, focused ion beams and transmission electron microscopes to practice some of the techniques learned in class.

Programming And Computing Component

The students will learn how to use VESTA to build atomic models.

Ethical Principles

All members of a group are responsible for the group’s work In any assessment, every student shall honestly disclose any help received and sources used. In an oral assessment, every student shall be able to present and answer questions about the entire assignment and solution.